Discrete tests for weak bits

ABSTRACT

A testing method for semiconductor memory that selects memory cells adjacent to the periphery of the memory array and to a memory twist. These memory cells are subjected to a more demanding test voltage and write recovery time to further stress the memory cells and reveal weak or marginally good memory cells.

FIELD OF THE INVENTION

The present invention relates generally to semiconductor memory devicesand, more particularly, to a method and apparatus for testing a memorydevice.

BACKGROUND OF THE INVENTION

Memory in integrated circuits must be tested to ensure reliability.Typically, integrated circuits are extensively tested both during andafter production and, in some cases, routinely during use after theyhave been installed in products. For example, memory devices, such asDRAMs, are tested during production at the wafer level and afterpackaging. They are also routinely tested each time a computer systemusing the DRAMs executes a power-up routine when power is initiallyapplied to the computer system. DRAMs are generally tested by writingknown data to each location in the memory and then reading data fromeach memory location to determine if the read data matches the writtendata. As the capacity of DRAMs and other memory devices continues toincrease, the time required to write and then read data from all memorylocations continues to increase, even though memory access timescontinue to decrease.

FIG. 1 shows a block diagram of a conventional semiconductor memorydevice 100 having an array 140 of eight memory blocks 145. The memoryarray 140 includes row decoder and access circuits 125 and columndecoder and access circuits 135. The memory device 100 also includesperipheral circuit 440 which includes, for example, the mode register ofthe memory device. Peripheral circuit 440 controls how the memory array140, and correspondingly, the memory blocks 145, are accessed (e.g.,burst type, burst length, read/write delays). Although not shown,peripheral circuit 440 is coupled to each row decoder and accesscircuitry 125 and column decoder and access circuitry 135. It is knownthat the number of memory blocks 145 that comprise memory array 140 mayvary depending on the implementation. Test controller 450 is coupled tothe memory device 100 through line 451. Test controller 450 providessignal information to memory device 100, peripheral circuit 440, anddecoder and access circuits 135, 125 to perform testing on memory device100. For example, test controller 450 will provide location signalinformation, read/write signal information, and other signal informationused to implement testing operations on memory device 100.

FIG. 2 shows the configuration of the memory device 100 of FIG. 1 ingreater detail. As shown, memory device 100 includes a memory array 140having eight memory blocks 145 (FIG. 1), although only one memory block145 is shown in FIG. 2. Memory block 145 is composed of two memorysub-blocks 155. Although described with one memory array 140, eightmemory blocks 145, and two sub-blocks 155, the number of memory arrays140, memory blocks 145, and memory sub-blocks 155 in device 100 can varydepending on the implementation. Each memory block 145 includes bitlines that extend through the sub-blocks 155. Bit lines 112, 114 arerepresentative of the many bitlines in block 145.

Memory block 145 has 1024 rows, M columns, and two sub-blocks 155, whereeach sub-block 155 has 512 rows. Conventionally, each row of memoryblock 145 is numbered sequentially starting with row number 0 as thefirst row in the memory block 145 and row number 1023 being the last rowin the memory block 145. Row number 511 is the last row in the uppersub-block 155 and row number 512 is the first row in the lower sub-block155. Although described with reference to memory block having 1024 rowsof memory, the number of rows of memory may vary depending on theimplementation.

FIG. 3 shows a memory sub-block 155 of FIG. 2 in greater detail. Memorysub-block 155 has a plurality of memory cells 170, for example, DRAMcells, that are arranged in rows 120 and columns 130, e.g., as an x-ygrid. Conductive bit lines 112, 114, 116, 118 extend the length of thememory array 140 and connect bit line contacts of respective memorycells 170 within the columns. Word lines 102, 104, 106, 107, 108, 109,110 extend the width of memory sub-block 155 and connect controlterminals of the access transistors in the memory cells of theirrespective rows. Known peripheral column and row decoder and accesscircuitry 135, 125 (FIG. 1) determine, in accordance with suppliedaddress data, selected bit lines and word lines upon which to propagatedata and enable signals respectively. Although not shown in FIG. 3, eachword line 102, 104, 106, 107, 108, 109, 110 is coupled to the rowdecoder and access circuitry 125, and each bit line 112, 114, 116, 118is coupled to the column decoder and access circuitry 135. The locationof memory cells can vary depending on the implementation. For example,although FIG. 2 shows memory cells located at some, but not all, of theintersections of row and column lines of the memory sub-block, otherimplementations may have memory cells at every intersection.

As indicated above, memory block 145 has 1024 rows of memory, M columns,and two sub-blocks 155, where each sub-block 155 has 512 rows of memory.Dummy rows, e.g., rows 102, 110, are not counted as part of the rows ofmemory. If memory sub-block 155 is the first of the two memorysub-blocks 155 (FIG. 2), then word line 104 represents the row lineadjacent to the top periphery of the memory sub-block 155 and the top ofthe memory block 145, i.e., row number 0. Word lines 107, 109 representthe row lines adjacent to the twist 160 of the memory sub-block 155,e.g., row numbers 254, 255, 256, and 257. Word line 108 represents therow line adjacent to the bottom periphery of the memory sub-block 155,i.e., row number 510, 511.

If memory sub-block 155 is the second of the two memory sub-blocks 155(FIG. 2), then word line 104 represents the row line adjacent to the topperiphery of the memory sub-block 155, i.e., row number 512, 513. Wordlines 107, 109 represent the row lines adjacent to the twist 160 of thememory sub-block 155, e.g., row numbers 766, 767, 768, and 769. Wordline 108 represents the row line adjacent to the bottom periphery of thememory sub-block 155 and the bottom of the memory block 145, i.e., rownumber 1023.

Bit line 114 represents the column line adjacent to the left peripheryof the memory sub-block 155, i.e., column 0, 1. Bit line 118 representsthe column line adjacent to the right periphery of the memory sub-block155, i.e., column M-1, M-2 if there are M columns in the memorysub-block 155. The bit lines extend through the memory block 145,therefore passing through each sub-block 155 in memory block 145although not shown.

One known method of testing a memory device requires what is known as abrute force approach of testing the entire memory array 140. During suchtesting, zeroes are written to all the memory cells 170 in the memoryarray 140. This is followed by reading each memory cell 170 to ensurethat the zeroes were correctly written and stored. Then ones are writtenin all the memory cells 170, which are then read to ensure that the oneswere correctly written and stored.

Another known memory test is the checkerboard test, where the memorycells 170 of an array 140 are divided into two groups. The first groupof memory cells 170 form the checkerboard, the second group of memorycells 170 is formed from the remaining cells also forms a similarcheckerboard. In the first step of the test, ones are written to all thememory cells 170 of the first group and zeroes are written to all thememory cells 170 of the second group. In the second step, all of thememory cells 170 are read to verify that the values were correctlywritten to and stored by the memory cells 170. In the third step of thetest, zeroes are written to all the memory cells 170 of the first groupand ones are written to all the memory cells 170 of the second group. Inthe fourth step, all of the memory cells 170 are read to verify that thevalues were correctly written to and stored by the memory cells 170. Theabove described checkerboard approach also serves to test the memorycell-to-memory cell isolation between memory cells 170 of an array 140.

Two significant values in the testing process are Vcc and tWR. Vcc isthe supply, or rail, voltage used for writing to (and refreshing) amemory cell 170. Typical testing circuitry uses a standard Vcc (e.g.,2.5V) as the full logic level, i.e., a “one.” Typical performancerequirements of a semiconductor memory may be seen, for example, in theMicron datasheet 256 mb DRAM specifications at(http://download.micron.com/pdf/datasheets/dram/256MSDRAM_E.pdf).

tWR stands for Write (data) Recovery time. As is known, burst length isthe word size of data that is written at a time. Burst length may be,for example, one, two, or four. Generally, tWR is referred to as thetime necessary to store data into a memory cell 170 before a pre-chargecan occur. If burst length is programmed to be greater than one, thentWR is the time necessary to store the last piece of data into a memorycell 170 before a pre-charge can occur. tWR is the necessarytime/minimum time to guarantee that data in the write buffer can befully written into the memory cell 170. If tWR is not satisfied, e.g.,if tWR is not sufficiently long enough to store data in a memory cell170, then the full data is not stored and a read failure, e.g., aninaccurate read, can result. Testing circuitry generally uses a standardtWR substantially similar to the tWR used in the actual performance ofthe memory. For example, according to the datasheet specification forthe Micron 256 mb DRAM, tWR is 12 ns.

As the size of memory arrays (e.g., 140) increases, so does the timerequired to test the arrays. Various proposals have been made todecrease the time required to test memory arrays 140. The time requiredto write known data to memory array 140 has been reduced by suchapproaches as simultaneously writing the same data to each column ofeach array one row at a time. However, some types of testing requirethat the word lines be kept at a fixed positive voltage for an extendedperiod of time, such as tens of milliseconds. When there are thousandsof word lines in one memory device, the memory testing takes longperiods of time since only one word line in each block of the memoryarray 140 may be accessed at a time.

An additional problem in memory testing arises because there are memorycells 170 in certain regions of a memory block 145 that are moresusceptible to faults or errors. As seen in FIG. 3 memory block 145 hasan area of memory cells 170 adjacent to the periphery of the memorysub-block 155 that form a fringe area. An area is adjacent if it is nextto or nearby another area. The fringe area may include the first rowe.g., rows 104, 108, adjacent to the dummy rows, e.g., rows 102. Furtherthe fringe area may include the first column, e.g., columns 114, 118,adjacent to dummy columns, e.g., columns 112. A memory sub-block 155having a folded digitline 160 (FIG. 3), e.g., a twist, has another areaof memory cells 170 adjacent to the twist 160 that forms another fringearea. For example, the fringe area adjacent to twist 160 may include therows, e.g., rows 107, 109, that are adjacent to the dummy rows, e.g.,rows 110, that are located adjacent to the twist 160. A memory cell 170in a fringe geographic region has inherent influences that can affectthe reliability of the memory cell.

An edge in a memory cell implies those memory cells located adjacent toor nearby the physical boundaries of a subarray/a block/a bank. In otherwords, an edge includes memory cells that either are adjacent to thedummy memory cells or have strongest interference with the dummy memorycells. Edge memory cells can be affected by the physics and/orelectronics of the corresponding dummy cells. Edge memory rows are rowslocated adjacent to or nearby the physical boundary of a subarray/ablock/a bank. Edge memory rows are not necessarily limited to theclosest row to the physical boundary and may include several rows closeto the physical boundary. Similarly, edge memory columns are rowslocated adjacent to or nearby the physical boundary of a subarray/ablock/a bank. Edge memory columns are not necessarily limited to theclosest column to the physical boundary and may include several columnsclose to the physical boundary. Edge subarrays, or edge blocks, aresubarrays located adjacent to or nearby the physical boundary of amemory bank.

It is known to provide dummy memory cells around the periphery of amemory sub-block 155 in order to assist process uniformity duringfabrication of the memory block 145. For example, in FIG. 3 memory cells170 disposed on word lines 102 and memory cells 170 disposed on bitlines 112 are dummy memory cells. Further, in a memory sub-block 155having a folded digitline 160, it is known to provide dummy cells aroundthe periphery of a folded digitline 160 in order to assist processuniformity during fabrication of the memory sub-block 155. Thus, memorycells 170 disposed on bit lines 110 are also dummy cells.

Memory cells located in certain areas of a memory block 145 tend to beweaker than other memory cells. For example, memory cells located closeto an edge of the memory block 145, or edge of a sub-block 155, tend tobe weaker or have a smaller margin of operation (i.e., “marginal”) thanmemory cells not located close to an edge. Further, memory cells locatedclose to a folded digitline of the memory block 145, or sub-block 155,tend to be weaker than memory cells not located close to twist 160.

It is also more difficult to test memory cells located in certain areasof a memory block 145. Memory cells located close to an edge of a memoryblock 145, or sub-block 155, are typically separated from the edge by adummy cell. Dummy cells typically have their word line grounded todisable their associated access transistors. Additionally, dummy cellsadjacent a peripheral column of the array have their bit line coupled toan intermediate voltage. Therefore, dummy cells located close to an edgeof a memory block, or sub-block, are not able to receive full voltages.Consequently, a dummy cell can influence the margin of operation of anadjacent memory cell and also the testing of the adjacent memory cell.Similarly, dummy cells located adjacent to a digitline twist affects themargin and testability of memory cells adjacent to these dummy cells.

Therefore, it is desirable to have a testing method that can effectivelytest discrete areas of a memory array. More specifically, it isdesirable to have a testing method for testing the margin of the memorycells located in the fringe areas of a memory block, such as memorycells 170 near the periphery of the memory array 140 (or memory block145 or sub-block 155) and memory cells near folded digitlines 160.

SUMMARY OF THE INVENTION

The present invention addresses the problems described above withtesting memory arrays and provides a memory testing method that testsdiscrete regions of memory arrays that are generally known to be weak ormarginally good.

Memory cells in the fringe areas of a memory array are tested under moredemanding testing requirements. For example, every memory cell in eachrow adjacent to the periphery of the memory array, or sub-array, iswritten to and read from using more demanding write characteristics.These more demanding write characteristics include using lower thanstandard voltage levels and less than standard tWR times. The use ofmore demanding testing specifications provides greater reliability inidentifying weak or only marginally good memory cells.

Although the testing method may be used in addition to conventionaltesting methods, the disclosed testing method may also be used in lieuof conventional testing. Moreover, testing selective, representationalmemory cells from the memory array can reduce testing time.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other features and advantages of the invention will be morereadily understood from the following detailed description of theinvention which is provided in connection with the accompanyingdrawings, in which:

FIG. 1 is a simplified block diagram of a conventional memory array andassociated circuitry;

FIG. 2 shows a portion of the FIG. 1 memory array in greater detail;

FIG. 3 shows a portion of the FIG. 1 memory array in even greaterdetail;

FIG. 4 is a flowchart of a test process in accordance with an exemplaryembodiment of the invention;

FIG. 5 shows a portion of a memory array under test in accordance withan exemplary embodiment of the invention; and

FIG. 6 is a flow chart showing the test process of FIG. 4 in greaterdetail.

DETAILED DESCRIPTION OF THE INVENTION

In the following detailed description, reference is made to theaccompanying drawings, which form a part hereof, and in which is shownby way of illustration specific embodiments in which the invention maybe practiced. These embodiments are described in sufficient detail toenable those of ordinary skill in the art to make and use the invention,and it is to be understood that structural, logical, or proceduralchanges may be made to the specific embodiments disclosed withoutdeparting from the spirit and scope of the present invention.

FIG. 4 is a flowchart of a process 199 for carrying out the testing of aregion in a memory device, in accordance with an exemplary embodiment ofthe invention. The process 199 is done in a column/row-wise fashion,testing memory cells in certain rows of the fringe areas of a sub-block155. Testing a memory sub-block 155 occurs in several iterations, whereeach iteration has sub-iterations. Each iteration of the memory testselects a different column of the sub-block 155 for testing. The processis reiterated for all of the columns of the memory sub-block 155. Eachsub-iteration of the memory test selects a different row of the memorysub-block 155 for testing. The memory cells being tested correspond tothe selected row and selected column. Although the process 199 isdescribed in reference to one sub-block 155, the illustrated testingprocess 199 is representational and in a preferred embodiment, theprocess 199 is applied to all sub-blocks 155 in the memory array 145simultaneously. For example, memory row number 0 in all sub-blocks areselected and tested simultaneously.

In segment P1, the first column of the memory sub-block is selected. Insegment P2, the first row of the memory sub-block is selected. Thememory cell at the selected row and column is tested.

In segment P3, the last row of the memory sub-block is selected. Thememory cell at the selected row and column is tested.

In segment P4, the row of the memory below the twist in the memorysub-block is selected. The memory cell at the selected row and column istested.

In segment P5, the row of the memory below the twist in the sub-block isselected. The memory cell at the selected row and column is tested.

In segment P6, if the currently selected column is the last row of thememory sub-block, then there are no more columns to be tested and theprocess ends. Otherwise, the process continues to segment P7, where thesequentially next column becomes the selected column. The processcontinues at segment P2.

When testing process 199 is completed, the first row of memory, the lastrow of memory, the row above a memory twist and the row below the memorytwist have been tested. Thus, the fringe areas of memory sub-block 155have been tested.

FIG. 5 depicts a system that tests memory sub-block 155 of a memoryarray 140 in accordance with an exemplary embodiment of the invention.Although only one sub-block 155 of a memory block 145 (e.g., of FIG. 2)of a memory array 140 (e.g., of FIG. 2) is shown, the testing of memorysub-block 155 is representational of every memory sub-block 155 in thememory array 140.

As in FIGS. 1-3, test controller 450 is coupled to the memory devicethat includes memory sub-block 155 through line 451. Test controller 450is, however, programmed through appropriate software, firmware, orhardware to provide signals to the memory device, its peripheralcircuitry, and its decoder and access circuit. By providing the signals,test controller 450 performs the testing as in FIG. 4 and, in moredetail, in FIG. 6. For that purpose, test controller 450 can be amicroprocessor, microcontroller, or any other component programmable toprovide suitable signals to test devices.

Initially, in a column/row-wise fashion, for example, the first column,i.e., column 270—column number 0, and the first row, i.e., row 280—rownumber 0, of the sub-block are selected. The memory cell correspondingto the selected column and selected row is tested. In the nextsub-iteration, the last row, i.e., row 282, of the sub-block isselected. Then the memory cell corresponding to the selected column andselected rows is tested. In the next sub-iteration, the row of memorybelow the folded digitline is selected, i.e., row 284. Then the memorycell corresponding to the selected column and selected row is tested. Inthe next sub-iteration, the row of memory above the folded digitline isselected, i.e., row 286. Then the memory cell corresponding to theselected column and selected row is tested. The selected column ischanged to a new selected column and the testing process is repeated andthe selected row starts again at the first row of each sub-block.Preferably, columns are selected incrementally, i.e., column number one,i.e., column 272, is selected after column number zero. When the lastcolumn of the memory block 145 has been tested, the test is completed.

Should a memory cell 170 fail a test, then the location of the memorycell 170 that failed is stored and the testing of the remainder of thememory array 140 continues. The testing process tallies the number ofmemory cell failures. If a predetermined number of memory cells 170fail, then the testing process quits. In another aspect, at a later timeusing the stored locations, accommodations can be made for the memorycells 170 that failed, e.g., redundant rows can be enabled, or ifpossible, the memory cell 170 can be repaired.

FIG. 6 is a flowchart of a process 200 showing the process 199 of FIG. 4in greater detail. The testing process 200 differs from the testingprocess 199 described above in that testing process 200 is describedwith reference to testing the entire memory array 140. In this example,the test is performed on an exemplary Micron 256 mb SDRAM memory arrayhaving at least one memory block 145 having 1024 rows, each sub-block155 having 512 rows, and one folded digitline per 256 rows. Theexemplary process 200 starts by writing ones to the entire memory block145. Then the process selects a single column at a time and selects andtests memory cells associated with different rows, beginning with columnnumber zero and proceeding sequentially until the last column is tested.Progression to a next segment in the test process assumes that theprevious process segment was successfully completed.

In segment S1, the memory blocks 145 within the memory array 140 areinitialized. Every memory array 140 has a specific manner in which it isprovided with power and initialized. For example, see Micron datasheet(referred to above), page 12, which specifies the appropriate manner toinitialize the Micron 256 mb SDRAM memory. Therefore, exact execution ofsegment S1 is dependent upon the particular memory being tested.

In segment S2, the mode register of the memory array 140 (FIG. 1) isprogrammed to indicate how data will be read from or written to thememory device. The mode register is used to define the specific mode ofoperation of the memory device. The read latency (e.g., thecolumn-address strobe (“CAS”) latency) is the delay, in clock cycles,between the registration of a READ command and the availability of thefirst piece of output data and can be set to two or three clock cycles.To execute the test program, the read latency is programmed to beequivalent to two. Read and write access to the memory device are burstoriented, the burst length is the maximum number of column locationsthat can be accessed for a given READ or WRITE command. For the testingprocess 200, the burst length is programmed to be equivalent to one(i.e., a single column). The first column is designated as the selectedcolumn.

In segment S3, the logic value of a logic one—Vtest (where Vtest issubstantially equivalent to 2.2 volts), is written to every memory cellin the memory array. The first row in each memory sub-block isdesignated as the selected row. In segment S4, the selected row in eachsub-block is activated. In segment S5, a zero is written to each memorycell corresponding to the selected column and the selected rows. Duringthe write operation, a loose tWR is used (e.g., twelve ns).

In segment S6, program remains idle for a period of time (e.g., “NOP”instruction). The no operation command is used to prevent unwantedcommands from being registered during idle or wait states. Operationsalready in progress are not affected.

In segment S7, a precharge occurs. A precharge is used to deactivate theselected row in each memory sub-block. The sub-block will be availablefor subsequent row access a specified time period after the prechargecommand is issued. (once a sub-block has been precharged, the sub-blockis in an idle state and must be activated prior to any READ or WRITEcommands being issued to that sub-block).

In segment S8, the selected row in each memory sub-block is reactivated.

In segment S9, a Raslo pause occurs. A Raslo is where the row addresssignal is of low logic level. The program keeps the low RAS signal logiclevel for a specific period of time, which is intended to allow the zeroto settle in the memory cells. In other embodiments of the invention,the Raslo pause is shorter to further stress the memory cell. A Raslomay also be used to discharge dummy cells.

In segment S10, the selected row in each memory sub-block activated insegment S4 is activated. The reactivation segment is to ensure that theselected rows are active before writing the opposite data to the memorycells. In segment S11, a logic level of one is written to the selectedmemory cells, i.e., those memory cells corresponding to the selectedcolumn and selected rows. During the write operation, a more demanding,shorter tWR and a more demanding Vtest are used, as described above.

In segment S12, the data is read from the selected memory cells. If thedata from each memory cell is not substantially equivalent to one, thenthe test process 200 records this failure. If a predetermined number ofmemory cells fail the test, then the test process is aborted. Otherwise,process 200 execution continues at segment S13.

In segment S13, segments S4-12 are potentially repeated for the last rowin each memory sub-block. If the currently selected row is the first rowof memory in each sub-block, then the last row of memory (e.g., rownumber 511) in each memory sub-block is designated as the selected rowand the process continues to segment S4. Otherwise, process 200execution continues at segment S14.

In segment S14, segments S4-12 are potentially repeated for the rowbelow the twist in each memory sub-block. If the currently selected rowis the last row of memory in each memory sub-block, then the row ofmemory below the twist in each sub-block (e.g., row number 256) isdesignated as the selected row and process 200 continues at segment S4.Otherwise, process 200 continues at segment S15.

In segment S15, segments S4-12 are potentially repeated for the rowabove twist in each memory sub-block. If the currently selected row isthe row of memory below the twist in each memory sub-block, then the rowof memory above the memory twist (e.g., row number 255) in each memorysub-block is designated as the selected row and process 200 continues atsegment S4. Otherwise, process 200 continues at segment S16.

In segment S16, segments S3-12 are potentially repeated for the nextcolumn. If the selected column is the last column in the memory array,then process is complete. Otherwise, the selected column is incrementedby one and process 200 execution returns to segment S3. Segment S16determines if all of the columns have been tested.

At the completion of process 200, selected memory cells located at thefringe areas of the memory array 140 have been tested. Since only aportion of an entire memory array 140 is tested, the test process 200 ofthe invention reduces the amount of time to test a memory array 140.

Thus, a testing process is provided that reduces the number of memorycells that are tested, as well as the time required to test the memoryarray. The testing process also identifies memory cells that are weak oronly marginally good and enables the opportunity to identify, and ifdesirable, repair those problematic memory cells.

The above-described method tests memory cells in fringe regions of amemory array or a memory device (e.g., memory cells near the peripheryand memory cells near the folded digitline). Since memory cells in thefringe regions may be more marginal, the memory cells are more sensitiveto the Vcc level. Therefore, a more demanding voltage level (i.e.,Vtest) is used for the test which is different from the typically usedVcc values of, e.g., 2.5V. For example, Vtest is set to a voltage lowerthan 2.5V (e.g., 2.2V+/−0.1 volts). In an exemplary preferredembodiment, Vtest is within approximately 88-92% of the Vcc. Forexample, if Vcc is 2.5V, then the Vtest is within approximately 2.2V to2.3V. Marginal memory cells are also more sensitive to the length of thetWR time, a tWR for testing is used which is different from, and moredemanding than, the standard tWR. A tWR is established having a shortertime delay than the standard 12 ns tWR. A short, i.e., a tight, tWR testis supposed to guard a memory cell that will have a problem retaininginformation when information is written to the memory cell. In apreferred embodiment, the tWR test is between approximately 79-96% ofthe standard tWR. For example, if the standard tWR is 11.5 ms, then thetWR test is within approximately 9.09 to 11.04 ms. With the use of thelower Vtest and shorter tWR, the testing process should reveal thosememory cells that are weak or marginally good memory cells 170.

While the invention has been described and illustrated with reference tospecific exemplary embodiments, it should be understood that manymodifications and substitutions could be made without departing from thespirit and scope of the invention. For example, although the inventionis described in reference to testing particular memory features, i.e.,tWR and voltage levels, other memory features may be tested as well.Further, although the invention is described with reference to testingparticular voltages and/or particular tWR times, the invention is not solimited. Additionally, the invention can be applied to the testing ofredundant memory elements, whether the redundant elements are locatedbetween dummy elements and the standard memory elements, or if theredundant elements are located in a different location, and not adjacentto the standard memory elements.

In another embodiment of the invention, memory array 140 does notinclude folded digitlines. Consequently, the testing process accordingto this embodiment would differ from the embodiment described withreference to FIG. 5 in that there would not be any testing of rowsadjacent to a memory twist.

In yet another embodiment of the invention, memory cells in rowsadjacent to the edges of the sub-block and memory cells in columnsadjacent to edges of the sub-block are selected for testing.

In yet another embodiment of the invention, memory cells in rowsadjacent to the edges of the sub-block, memory cells in rows adjacent tothe twists of the sub-block, and memory cells in columns adjacent toedges of the sub-block are selected for testing.

In yet another embodiment of the invention, memory cells in columnsadjacent to edges of the sub-block is selected for testing.

In another embodiment of the invention, the memory array 140 is testedin a column-wise fashion, instead of the process above which is testedin a row-wise fashion. In the embodiment, the fringe regions of thememory array are also tested.

In yet another embodiment, the testing process of the invention isapplied to a memory wafer, where the dies on the periphery of the waferare selected for testing.

In other aspects of the different embodiments of the invention, morethan one row in a sub-block adjacent to a fringe is selected to beconcurrently tested. For example, memory cells in the first and secondrows of a sub-block are tested, then memory cells in the last and secondto last rows of the sub-block are tested. Similarly, more than onecolumn of memory cells may be selected to be tested concurrently.

Accordingly, the invention is not to be considered as limited by theforegoing description but is only limited by the scope of the claims.

1. A method of testing a memory device, the method comprising: selectinga memory cell to be tested from a fringe region of an array of thememory device; and testing said selected memory cell using at least onetest parameter that is different than a test parameter to be used formemory cells not in the fringe region.
 2. The method of claim 1, whereinsaid act of selecting comprises selecting the memory cell from a regionthat is adjacent to a periphery of said array.
 3. The method of claim 1,wherein said act of selecting comprises selecting the memory cell from aregion that is adjacent to a folded bitline of said array.
 4. The methodof claim 1, wherein said at least one parameter is a first voltage levelthat is different from a voltage level used to test memory cells not inthe fringe.
 5. The method of claim 4, wherein said first voltage levelis different than a supply voltage.
 6. The method of claim 5, where saidfirst voltage level is less than approximately 2.5V.
 7. The method ofclaim 1, wherein said act of testing comprises testing said selectedmemory cell using at least one test parameter more demanding than saidtest parameter to be used for memory cells not in the fringe region. 8.The method of claim 1, wherein said at least one parameter is a firstwrite recovery time that is different from a second write recovery timeused to test memory cells not in the fringe.
 9. The method of claim 8,wherein said first write recovery time is shorter than approximately 12ns.
 10. The method of claim 8, wherein said first write recovery time isbetween approximately 79-96% of the second write recovery time.
 11. Amethod of testing a memory device, the method comprising: selecting acolumn of a memory array of said memory device to be tested; selecting arow of said memory array to be tested, said selected column and rowdefining a memory cell in a fringe region of said memory array; writingfirst data to each said memory cell in said memory array; activatingsaid selected row for reading and writing; providing second data to amemory cell corresponding to said selected row and selected column, saidsecond data being different from said first data; precharging saidselected row for deactivating said selected row for reading and writing;activating said selected row for reading and writing; re-activating saidselected row for reading and writing; providing said first data to saidmemory cell corresponding to said selected row and selected column,where said first data is provided at a lower voltage than a voltage tobe used to provide test data to memory cells not in the fringe region,where said first data is provided at a shorter write release time than awrite release time to be used to provide test data to memory cells notin the fringe region; reading test data from said memory cell; anddetermining if said test data is correct.
 12. The method of claim 11,further comprising: initializing the memory array for access andstorage.
 13. The method of claim 11, further comprising: loading a moderegister associated with said memory array to establish the write mode.14. The method of claim 11, wherein the lower voltage is betweenapproximately 88% and approximately 92% of the voltage used to providetest data to memory cells not in the fringe region.
 15. The method ofclaim 11, wherein the shorter write release time is betweenapproximately 79% and approximately 96% of the write release time usedto provide test data to memory cells not in the fringe region.
 16. Amethod of testing an integrated circuit memory, said method comprising:identifying a first plurality of memory cells of a fringe region of saidintegrated circuit memory for testing; and determining if said firstplurality of memory cells are weak cells using at least one testparameter that is different than a test parameter to be used for memorycells not in the fringe region.
 17. The method of claim 16, wherein saidact of determining comprises stressing said identified first pluralityof memory cells to determine if they are weak cells.
 18. The method ofclaim 17, wherein said act of stressing comprises applying a testvoltage at a level below a test voltage used for other memory cells ofsaid integrated circuit memory.
 19. The method of claim 17, wherein saidact of stressing comprises applying a shorter than standard writerelease time.
 20. The method of claim 16, wherein said first pluralityof memory cells comprises memory cells located in a row adjacent to atop edge of said memory.
 21. The method of claim 16, wherein said firstplurality of memory cells comprises memory cells located in a rowadjacent to a bottom edge of said memory.
 22. The method of claim 16,wherein said first plurality of memory cells comprises memory cellslocated in a row adjacent to a folded digitline of said memory.
 23. Themethod of claim 16, wherein said first plurality of memory cellscomprises memory cells located in a column adjacent to at least one of aright edge and a left edge of said memory.
 24. The method of claim 16,wherein said first plurality of memory cells comprises memory cellslocated in at least one of a first and second row of memory adjacent toan edge of said memory.
 25. The method of claim 24, wherein said secondrow of memory is adjacent to said first row of memory.
 26. The method ofclaim 24, wherein said second row of memory is not adjacent to saidfirst row of memory.
 27. The method of claim 24, wherein said edge ofsaid memory is a top edge of said memory.
 28. The method of claim 24,wherein said edge of said memory is a bottom edge of said memory. 29.The method of claim 16, wherein said first plurality of memory cellscomprises memory cells located in at least one of a first and secondcolumn of memory adjacent to an edge of said memory.
 30. The method ofclaim 29, wherein said second column of memory is adjacent to said firstcolumn of memory.
 31. The method of claim 29, wherein said second columnof memory is not adjacent to said first column of memory.
 32. The methodof claim 29, wherein said edge of said memory is a right edge of saidmemory.
 33. The method of claim 29, wherein said edge of said memory isa left edge of said memory.
 34. A system for testing memory devices,comprising: test control circuitry; and connecting circuitry thatconnects the test control circuitry to a memory device under test; thetest control circuitry providing signals through the connectingcircuitry to: select a memory cell to be tested from a fringe region ofan array of the memory device; and test said selected memory cell usingat least one test parameter that is different than a test parameter tobe used for memory cells not in the fringe region.
 35. A system fortesting memory devices, comprising: test control circuitry; andconnecting circuitry that connects the test control circuitry to amemory device under test; the test control circuitry providing signalsthrough the connecting circuitry to: select a column of a memory arrayof said memory device to be tested; select a row of said memory array tobe tested, said selected column and row defining a memory cell in afringe region of said memory array; write first data to each said memorycell in said memory array; activate said selected row for reading andwriting; provide second data to a memory cell corresponding to saidselected row and selected column, said second data being different fromsaid first data; precharge said selected row for deactivating saidselected row for reading and writing; activate said selected row forreading and writing; re-activate said selected row for reading andwriting; provide said first data to said memory cell corresponding tosaid selected row and selected column, where said first data is providedat a lower voltage than a voltage to be used to provide test data tomemory cells not in the fringe region, where said first data is providedat a shorter write release time than a write release time to be used toprovide test data to memory cells not in the fringe region; read testdata from said memory cell; and determine if said test data is correct.36. A system for testing memory devices, comprising: test controlcircuitry; and connecting circuitry that connects the test controlcircuitry to a memory device under test; the test control circuitryproviding signals through the connecting circuitry to: identify a firstplurality of memory cells of a fringe region of said integrated circuitmemory for testing; and determine if said first plurality of memorycells are weak cells using at least one test parameter that is differentthan a test parameter to be used for memory cells not in the fringeregion.